JEOL 7800F FEG-SEM

The JEOL 7800F is a high resolution FEG SEM which delivers stable analysis at ultra-low kV and large probe current. It is capable of high-resolution imaging at low kV using a specimen bias (GB Mode) giving excellent signal-to-noise ratio even for poorly conducting samples.

An energy filter is mounted directly below the upper electron detector (UED), so energy selection is possible.  Secondary electrons and backscattered electrons can be selected accurately allowing composition observation of the top surface of the specimen using a backscattered electron image at low accelerating voltages.

4 types of detectors, including an upper electron detector (UED), upper secondary electron detector (USD), backscatter electron detector (BED), and a lower electron detector (LED) are incorporated. With the BED, atomic weight and channelling contrasts can be clearly observed. The LED ET SE detector enables acquisition of images with a 3-dimensional appearance, including the surface roughness – topographic information.

_{Image Courtesy of JEOL}