Zeiss Xradia 520 Versa XRM

The ZEISS Xradia 520 Versa 3D X-ray microscope unlocks new degrees of flexibility for your scientific discovery. Building on industry-best resolution and contrast, Xradia 520 Versa expands the boundaries of non-destructive imaging for breakthrough flexibility and discernment critical to your research. Innovative contrast and acquisition techniques free you to seek—and find—what you've never seen before to move beyond exploration and achieve discovery.

ZEISS Xradia 520 Versa leverages technology from synchrotron X-ray microscopy and has several key features that we believe are integral to potential. These include:

1. Sub-micron (<0.7 μm) spatial resolution at large working distances

2. Selectable resolution and field of view pairings

3. Optimized Scintillators for Absorption Contrast

4. Phase Contrast

5. Highest resolution for in-situ experiments

^{Image Courtesy of Zeiss}